The accurate dimensional measurements within small internal structures

This paper shows that the dimension of internal structure of a component can be measured remotely to a resolution better than 5 μm by use of the combination of high resolution optical microscopy and image processing.A specialised high resolution, long working distance and diffraction limited lens was used to image within the component. A series of digital images were made to map spatially the interior of the component. An edge detector was then used to localise the specific location of features in order that an accurate internal measurement could be made. A visualisation of the internal surface finish was also achieved.     

Supramolecular phthalocyanine dimers based on the secondary dialkylammonium cation/dibenzo-24-crown-8 recognition motif

[formula: see text] New unsymmetrically substituted DB24C8-phthalocyanines, which are able to form complexes with suitable dialkylammonium cations, have been prepared. These complexes most probably have a pseudorotaxane geometry.     

Application of the holographic carrier fringe and FFT technique for deformation measurement

This paper describes a holographic system based on the use of fibre optics and automatic spatial carrier fringe pattern analysis. Carrier fringes are generated by simply translating the object beam between two exposures. Single-mode optical fibres are used to transfer both the object and reference beams. The fast Fourier transform method is used to process the interferograms: it extracts phase from fringe patterns resulting from the interference of tilted wavefronts. The method is illustrated by measuring the deformation of an arbitrarily clamped, uniformly loaded circular plate. The results are given for the perspective plot of the out-of-plane deformation field, the maps of wrapped and unwrapped phase, and a contour map of the unwrapped phase.     

Low temperature scanning force microscopy of the Si(111)-(7x7) surface

A low temperature scanning force microscope (SFM) operating in a dynamic mode in ultrahigh vacuum was used to study the Si(111)- (7x7) surface at 7.2 K. Not only the twelve adatoms but also the six rest atoms of the unit cell are clearly resolved for the first time with SFM. In addition, the first measurements of the short range chemical bonding forces above specific atomic sites are presented. The data are in good agreement with first principles computations and indicate that the nearest atoms in the tip and sample relax significantly when the tip is within a few A of the surface.